■ 제 목: Introduction to the easy-to-miss scanning probe microscopy basics and the latest application technology (2024)

■ 연 사:  조상준 전무 (파크시스템스)                     

■  일 시:  2024년 4월 2일(화) 오후 4시 

■  장 소:  응용공학동 1층 영상강의실 

■ Host :  조힘찬 교수 

Scanning Probe Microscopy (SPM) is a versatile and powerful third-generation microscopy technique for studying samples on the nanoscale. It not only allows imaging of the three-dimensional shape of specimens at nanometer resolution but also provides various surface measurement parameters, including electrical, magnetic, thermal, and other properties, based on the needs of scientists and engineers. Among SPM techniques, the Atomic Force Microscope (AFM) is widely used and serves as a platform for various SPM technologies. Measuring the AFM cantilever's response to the sample has played a crucial role in investigating diverse material properties. It has made significant contributions to advanced materials research. As qualitative AFM techniques evolve into quantitative methods, automated industrial AFMs have surged in the past decade, especially in cutting-edge industries such as semiconductors and displays. Due to its wide range of applications, AFM continues to evolve as an essential technology for researching and advancing nanotechnology. This lecture will explore the diverse possibilities and outcomes of AFM.