= 아 래 =
1. 일 시 : 2013. 5. 21 (화), 16:00 ~
2. 장 소 : 응용공학동 1층 영상강의실
3. 연 사 : 김윤석 교수 (성균관대학교 신소재공학부)
4. 제 목 : Local Probing of Material Properties using Scanning Probe Microscopy
As nanotechnology has been developed rapidly, device size is subsequently becoming smaller and understanding of nanoscale material properties are becoming of great importance. However, nanoscale control and manipulation of matter is not yet fully explored and understood. Furthermore, while bias-induced processes underpin basic functionalities of ferroelectric memories, resistive switching memories, batteries, fuel cells, and other electric/electrochemical systems, only average behaviors have been exploited by macroscopic measurement tools. Since scanning probe microscope (SPM) provides local information of material properties and their dynamic behavior, the SPM can yield comprehensive understanding of these phenomena ranging from device to atomic levels. In this presentation, I will summarize our recent effort on the advanced SPM techniques for probing materials properties on the nanoscale. In particular, the recent studies of electro-chemical/mechanical phenomena in functional oxides will be presented.