Date 2019-04-09 

■ Title :  Time-resolved X-ray microdiffraction studies for ferroelectric film capacitors


 Speaker :  Prof. Ji young Jo (GIST, School of MSE)


■ Data and time:  4/9(Tue) 16:00


■ Venue:  Applied Engineering Building (W1) 1st Floor, Multimedia Lecture Room


 Host :  Prof. Seungbum Hong


 Abstract :  Dielectrics, which are mainly used as an intermediate layer of a capacitor element, have special properties as well as charge storage. For example, ferroelectric or piezoelectric. In this presentation, we briefly introduce some examples of how ferroelectric materials or piezoelectric materials perform under the electric field.