= 아 래 =
1. 일 시 : 2013. 11. 19 (화), 16:00 ~
2. 장 소 : 응용공학동 1층 영상강의실
3. 연 사 : Dr. Jeung-hyun Jeong (KIST, Photo-electronic Hybrids)
4. 제 목 : Electrical and optical characterization of photovoltaiclosses in CIGS thin film solar cells
CIGS thin film solar cell has recently demonstrated the outstanding photovoltaic conversion efficiency of 20.8% at a laboratory scale, now proving its superiority over the Si solar cell. Despite its promising future as a renewable energy source, CIGS photovoltaics (PV) has been experiencing considerable difficulties in exactly transferring the lab-scale technologies to industry production, because we knows very few about the CIGS PV physics. Many researchers are trying to find better ways for diagnosing and understanding the CIGS solar cells. In this talk, with mostly unique experimental results we acquired, I would like to give you how to characterize the efficiency losses in the module level and the junction level, and how to connect different data acquired from various tools for efficiency loss analysis. This talk will not aim at reaching complete understanding on CIGS physics or righteous characterization method, but at sharing what we could understand by characterizing with various methods (electroluminescence mapping & spectroscopy, capacitance profiling, defect diagnosis, electron-beam-induced current, temperature-dependent current-voltage, and transmission line method, etc) for several examples.