학과 정기세미나 안내
: 지식기반 첨단소재의 설계 및 이해를 위한 고분해능 특성평가
high-resolution characterization for understanding and knowledge-based design
of advanced materials)
■ 연사 : 최벽파
교수 (카이스트, 신소재공학과 부교수)
■ 일시 : 3월 15일 (화) 16:00
■ 장소 : 응용공학동 (W1) 1층 영상강의실
■ Abstract : Atom Probe Tomography (APT) is a high-resolution
characterization method that enables three-dimensional elemental mapping with
near-atomic resolution. Therefore, APT is highly useful for characterizing
advanced materials and for understanding their structure-property
This presentation gives an overview of the APT-related research done
by the author. The materials systems which will be presented are advanced
high-strength steels and nanostructured materials for various applications.
These materials can undergo complex changes during synthesis and processing,
and it will be discussed how local chemical changes such as nano-precipitation,
segregation to internal interfaces and elemental partitioning across phase
boundaries can significantly affect the material properties. Furthermore, we
will emphasize the importance of correlating APT data with theoretical
predictions, for instance made by ab-initio density functional theory, and with
other experimental techniques such as transmission electron microscopy (TEM).
It will be shown that information gathered from these different techniques can
serve as a basis of a knowledge-based rather than empirical approach of
designing advanced materials.
Finally, we will present a new methodology for coupling chemical and
crystallographic analyses at the atomic-scale, using joint APT / TEM nano-beam
diffraction analyses on identical samples. This method has been used for
quantifying solute segregation to grain boundaries in a nanocrystalline steel
as a function of grain boundary character and misorientation.