KAIST doctoral candidate Tae Wan Kim (Prof. Kyung Wook Paik) from the Department of Materials Science and Engineering received the Intel Best Student Paper Award at the 2014 Electronic Components and Technology Conference (ECTC) in Florida, United States this May 28th. At the 2013 ECTC event in Las Vegas, United States, Kim presented his research that was carried out in collaboration with Nokia and received recognition for solving the issue of short-circuiting between micro-gap junction electrodes.